Symposium on electron metallography : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 23, 1959

著者

• American Society for Testing and Materials. Committee E-4 on Metallography
• Annual Meeting American Sciety for Testing Materials

書誌事項

Symposium on electron metallography : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 23, 1959

（ASTM special technical publication, no. 262）

American Society for Testing Materials, c1960

注記

"sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."

This is v.2 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

詳細情報

• NII書誌ID(NCID): BA01666377
• LCCN: 59015659
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia, Pa.
• ページ数/冊数: 128 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00068096