Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

著者

• American Society for Testing and Materials. Subcommittee II on Fractography

書誌事項

Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

（ASTM special technical publication, 453）

American Society for Testing and Materials, [1969]

注記

"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."

Includes bibliographies

詳細情報

• NII書誌ID(NCID): BA02975967
• ISBN:
  • 0803100132
• LCCN: 76078439
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia
• ページ数/冊数: v, 235 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA460
  • DC : 620.1/6/6
• 件名:
  • LCSH : Fractography -- Congresses
  • LCSH : Electron microscope -- Congresses
• 親書誌ID:
  • BA00068096