Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

Author(s)

• American Society for Testing and Materials. Subcommittee II on Fractography

Bibliographic Information

Electron microfractography : a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials

（ASTM special technical publication, 453）

American Society for Testing and Materials, [1969]

Note

"Sponsored by Subcommittee II on Fractography of ASTM Committee E-24 on Fracture Testing of Metals."

Includes bibliographies

Details

• NCID: BA02975967
• ISBN:
  • 0803100132
• LCCN: 76078439
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Philadelphia
• Pages/Volumes: v, 235 p.
• Size: 24 cm
• Classification:
  • LCC : TA460
  • DC : 620.1/6/6
• Subject Headings:
  • LCSH : Fractography -- Congresses
  • LCSH : Electron microscope -- Congresses
• Parent Bibliography ID:
  • BA00068096