Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

Author(s)

• NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods
• Tanner, B. K. (Brian Keith)
• Bowen, D. Keith (David Keith)

Bibliographic Information

Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

edited by Brian K. Tanner and D. Keith Bowen

（NATO advanced study institutes series, ser. B . Physics ; v. 63）

Plenum Press, c1980

Note

"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

• NCID: BA03216360
• ISBN:
  • 0306406284
• LCCN: 80026509
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.
• Pages/Volumes: xxvi, 589 p.
• Size: 26 cm
• Classification:
  • LCC : QD921
  • DC19 : 548/.5
• Subject Headings:
  • LCSH : Crystals -- Defects -- Congresses
  • LCSH : X-ray crystallography -- Congresses
• Parent Bibliography ID:
  • BA00221036