Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

著者

• NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods
• Tanner, B. K. (Brian Keith)
• Bowen, D. Keith (David Keith)

書誌事項

Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

edited by Brian K. Tanner and D. Keith Bowen

（NATO advanced study institutes series, ser. B . Physics ; v. 63）

Plenum Press, c1980

注記

"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA03216360
• ISBN:
  • 0306406284
• LCCN: 80026509
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, N.Y.
• ページ数/冊数: xxvi, 589 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QD921
  • DC19 : 548/.5
• 件名:
  • LCSH : Crystals -- Defects -- Congresses
  • LCSH : X-ray crystallography -- Congresses
• 親書誌ID:
  • BA00221036