Rational fault analysis

Author(s)

• Symposium on Rational Fault Analysis
• Saeks, Richard
• Liberty, Stanley R.
• United States. Office of Naval Research
• United States. Army Research Office

Bibliographic Information

Rational fault analysis

edited by Richard Saeks, Stanley R. Liberty

（Electrical engineering and electronics, 1）

M. Dekker, c1977

Note

Proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University, August 19-20, 1974.

Co-sponsored by the Office of Naval Research and the Army Research Office

Includes bibliographies and index

• NCID: BA03934943
• ISBN:
  • 0824765419
• LCCN: 76040363
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: ix, 241 p.
• Size: 24 cm
• Classification:
  • LCC : TK7870
  • DC : 621.3815/1/028
• Subject Headings:
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Reliability -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses
• Parent Bibliography ID:
  • BA0010842X