Integrated circuit quality and reliability

Author(s)

• Hnatek, Eugene R.

Bibliographic Information

Integrated circuit quality and reliability

Eugene R. Hnatek

（Electrical engineering and electronics, 41）

Marcel Dekker, c1987

Note

Includes bibliographies and index

Details

• NCID: BA03980361
• ISBN:
  • 0824776682
• LCCN: 87009256
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xiii, 698 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability
• Parent Bibliography ID:
  • BA0010842X