Thin film and depth profile analysis
Author(s)
Bibliographic Information
Thin film and depth profile analysis
（Topics in current physics, 37）
Springer-Verlag, 1984
- : us
- : gw
Available at / 41 libraries
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National Institutes of Natural Sciences Okazaki Library and Information Center図
: U.S.431.86/TH49117342213
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Institute of Materials and Systems for Sustainability, Nagoya University未来材料研
: us428.4||T40847256
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Includes bibliographical references and index
