Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987

著者

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Weber, Eicke R.

書誌事項

Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987

edited by Eicke R. Weber

（Materials science monographs, 44）

Elsevier, 1987

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA04031349
• ISBN:
  • 0444428925
• LCCN: 87027177
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam ; Tokyo
• ページ数/冊数: x, 320 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• 親書誌ID:
  • BA00014483