Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983

Author(s)

• Chinese-Japanese Electron Microscopy Seminar
• 橋本, 初次郎 ハシモト, ハツジロウ
• Chung-kuo tien tzu hsien wei ching hsüeh hui

Bibliographic Information

Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983

organized by Chinese Society of Electron Microscopy ; edited by H. Hashimoto ... [et al.]

International Dept., Business Center for Academic Societies Japan, c1985

Note

Includes bibliographies and index

Details

• NCID: BA04238405
• ISBN:
  • 4930813115
• LCCN: 86205567
• Country Code: ja
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Tokyo, Japan
• Pages/Volumes: 279 p.
• Size: 23 cm
• Classification:
  • LCC : QH212.E4
  • DC19 : 502/.8/25
• Subject Headings:
  • LCSH : Electron microscopy -- Congresses