Proceedings

著者

• IEEE Workshop on Simulation & Test Generation Environments
• IEEE Computer Society
• IEEE Computer Society. Test Technology Committee

書誌事項

Proceedings

IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society, Test Technology Committee

IEEE Computer Society Press , Order from IEEE Computer Society, c1986

• pbk.
• hard
• microfiche

注記

Includes bibliographies and index

"IEEE Computer Society order number 732."

"IEEE catalog number 86CH2296-2."

• NII書誌ID(NCID): BA04424691
• ISBN:
  • 0818607327
  • 0818687320
  • 0818647329
• LCCN: 86080457
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.,Los Angeles, CA
• ページ数/冊数: vii, 179 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.395
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses