sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society c2003

Available at 1 libraries

sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation

IEEE Computer Society Press c1997

Available at 1 libraries

IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society, Test Technology Committee

IEEE Computer Society Press , Order from IEEE Computer Society c1986

pbk. , hard , microfiche

Available at 2 libraries

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press 1983

Available at 1 libraries

sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , order from IEEE Computer Society c1981

Available at 1 libraries

sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office c1979

Available at 2 libraries