Proceedings

Author(s)

• IEEE Workshop on Simulation & Test Generation Environments
• IEEE Computer Society
• IEEE Computer Society. Test Technology Committee

Bibliographic Information

Proceedings

IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society, Test Technology Committee

IEEE Computer Society Press , Order from IEEE Computer Society, c1986

• pbk.
• hard
• microfiche

Note

Includes bibliographies and index

"IEEE Computer Society order number 732."

"IEEE catalog number 86CH2296-2."

Details

• NCID: BA04424691
• ISBN:
  • 0818607327
  • 0818687320
  • 0818647329
• LCCN: 86080457
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.,Los Angeles, CA
• Pages/Volumes: vii, 179 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC19 : 621.395
• Subject Headings:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Automatic checkout equipment -- Congresses