The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985

著者

• International Test Conference
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985

sponsored by the IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press , Order from IEEE Computer Society, 1985

• pbk.
• hard
• microfiche

注記

Includes bibliographies and index

"IEEE catalog no. 85CH2230-1."

"Computer Society order no. 641."

詳細情報

• NII書誌ID(NCID): BA04429039
• ISBN:
  • 081860641X
  • 0818646411
• LCCN: 85062324
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.,Los Angeles, CA
• ページ数/冊数: xxx, 988 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC19 : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Testing -- Congresses
  • LCSH : Semiconductors -- Testing -- Congresses