Logic testing and design for testability

Author(s)

• 藤原, 秀雄 フジワラ, ヒデオ

Bibliographic Information

Logic testing and design for testability

Hideo Fujiwara

（MIT Press series in computer systems）

MIT Press, c1985

Note

Bibliography: p. [272]-278

Includes index

Details

• NCID: BA0446462X
• ISBN:
  • 9780262561990
• LCCN: 85000084
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Cambridge, Mass.
• Pages/Volumes: x, 284 p.
• Size: 24 cm
• Classification:
  • LCC : TK7868.L6
  • DC19 : 621.3815/37
• Subject Headings:
  • LCSH : Logic circuits -- Testing
• Parent Bibliography ID:
  • BA00107303