Secondary ion mass spectrometry : SIMS VI

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書誌事項

Secondary ion mass spectrometry : SIMS VI

editors A. Benninghoven, A.M. Huber, H.W. Werner

Wiley, c1988

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内容説明・目次

内容説明

The SIMS conference is recognized worldwide as a distinguished forum for those involved in the study and use of SIMS techniques, bringing together scientists working in fundamental research and instrument development, researchers using the SIMS method of analysis, service companies and instrument manufacturers. This book provides a comprehensive overview by leading experts, not only about current applications but also potential future uses for this increasingly important technique. The contents include details of the latest developments, notably the understanding of fundamental phenomena; the development of instruments which can exploit secondary emission phenomena for the purpose of elementary and isotopic analysis of very small quantities of matter; applications in many fields of science and technology: electronics, metallurgy, surfaces, organic materials, biology, medicine and geology.

目次

  • Fundamentals
  • Instrumentation
  • Time of Flight SIMS
  • Quantification
  • Ion Imaging
  • Depth Profiling
  • Combined Techniques
  • Organic Materials
  • Applications in Electronics
  • Electronic Materials
  • Post-Ionization
  • Applications in Biology
  • Applications in Geology
  • Applications in Metallurgy
  • Surface Studies.

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