Pattern recognition and artificial intelligence : towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988

Author(s)

• Gelsema, Edzard S.
• Kanal, Laveen N.

Bibliographic Information

Pattern recognition and artificial intelligence : towards an integration : proceedings of an international workshop held in Amsterdam, May 18-20, 1988

edited by Edzard S. Gelsema and Laveen N. Kanal

（Machine intelligence and pattern recognition, v. 7）

North Holland , Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1988

Note

Includes indexes

Description and Table of Contents

Description

This volume brings together the results of research into the methodology and applications of pattern recognition, with particular emphasis given to the incorporation of artificial intelligence methodologies into pattern recognition systems.The first part of this volume covers image analysis and processing software, systems and algorithms. Pattern analysis and classifier design are dealt with in part two, while the last part deals with model based and expert systems, including uncertainty calculus methods in pattern analysis and object recognition. A number of specific application areas are considered, including such diverse topics as fingerprinting, astronomy, molecular biology and pathology.

Table of Contents

Part I: Image Processing. Image Processing Systems: (Contributors: R. Bartels, P. Dewaele, A. Oosterlinck, E.H.J. Persoon, R. Roos, J. Vandeneede, D. van den Oudenhoven, P. Wambacq, I.T. Young). Image Processing Algorithms: (Contributors: G.L. Beckers, J. Bigun, P.-E. Danielsson, A.C.M. Dumay, C.A. Essed, A. Falsafi, J.J. Gerbrands, F.C.A. Groen, W.A. Levenbach, H. Minderhoud, G. Nagy, H. Peng, J.H.C. Reiber, K.J. Rijnierse, P.W. Serruys, A.W.M. Smeulders, H. Stark, G.T. Toussaint, P.J.H. van Cuyck, L.J. van Vliet, M. Worring, Q.-Z. Ye, I.T. Young, F. Zijlstra). Part II: Pattern Recognition (Contributors: E. Backer, R.P.W. Duin, E.S. Gelsema, A.K. Jain, M.J. Kurtz, S.D. Morgera, C.E. Queiros, M.D. Ramaswami, K. Siedlecka, W. Siedlecki, J. Sklansky, M.R. Soleymani, T. Timmers). Part III: Artificial Intelligence and Pattern Recognition (Contributors: E. Backer, R.K. Bhatnagar, C. Cocca, B.M. Dawant, B. Dubuisson, J. Gordon, G. Harauz, J. Ireland, B.H. Jansen, M.M. Jordan, L.N. Kanal, D. McDougall, E. Mandler, M.A. Musen, A. Oosterlinck, W.J. Perkins, J. Piper, J. Schurmann, C. Smets, A.W.M. Smeulders, P. Suetens, S. Towers, J. van der Lei, A.M. van Ginneken, G. Verbeeck). Discussions. Index.

by "Nielsen BookData"

Details

• NCID: BA05085376
• ISBN:
  • 0444871373
• LCCN: 88031025
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam ; Tokyo,New York, N.Y.
• Pages/Volumes: xv, 499 p.
• Classification:
  • LCC : Q327
  • DC19 : 006.4
• Subject Headings:
  • LCSH : Pattern perception
  • LCSH : Artificial intelligence
  • LCSH : Image processing
• Parent Bibliography ID:
  • BA00108270