Atom-probe field ion microscopy and its applications

Author(s)

• 酒井, 明 サカイ, アキラ
• Pickering, H. W.
• 桜井, 敏雄 サクライ, トシオ

Bibliographic Information

Atom-probe field ion microscopy and its applications

Toshio Sakurai, A. Sakai, H.W. Pickering

（Advances in electronics and electron physics : supplement / edited by L. Marton ; assistant editor, Claire Marton ; editorial board, T. E. Allibone ... [et al.], Supplement 20）

Academic Press, c1989

Note

Bibliography: p. 275-292

Includes index

Details

• NCID: BA06995219
• ISBN:
  • 0120145820
• LCCN: 63012814
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: vii, 299 p
• Size: 24 cm
• Classification:
  • NDC7 : 549
• Parent Bibliography ID:
  • BA00541897