Transmission electron microscopy : physics of image formation and microanalysis
著者
書誌事項
Transmission electron microscopy : physics of image formation and microanalysis
（Springer series in optical sciences, v. 36）
Springer-Verlag, c1989
2nd ed.
- : gw
- : us
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注記
Bibliography: p. 465-536
Includes index
内容説明・目次
内容説明
The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy.
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