Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida

Author(s)

• Granger, Edward M.
• Society of Photo-optical Instrumentation Engineers
• University of Alabama in Huntsville. Center for Applied Optics

Bibliographic Information

Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida

Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 776）

SPIE, c1987

• : pbk

Note

Includes bibliographies and index

Details

• NCID: BA0711948X
• ISBN:
  • 0892528117
• LCCN: 87061625
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: vi, 123 p.
• Size: 28 cm
• Classification:
  • LCC : TA1750
  • DC20 : 621.381/045
• Subject Headings:
  • LCSH : Optoelectronic devices -- Measurement -- Congresses
  • LCSH : Optical measurements -- Congresses
• Parent Bibliography ID:
  • BA0022700X