Introduction to analytical electron microscopy

著者

• Hren, John J.
• Goldstein, Joseph
• Joy, David C.
• Electron Microscopy Society of America
• Microbeam Analysis Society. Conference

書誌事項

Introduction to analytical electron microscopy

edited by John J. Hren, Joseph I. Goldstein, and David C. Joy

Plenum Press, c1979

注記

"Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society."

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA07286903
• ISBN:
  • 0306402807
• LCCN: 79017009
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xv, 601 p.
• 大きさ: 27 cm
• 分類:
  • LCC : TA417.23
  • DC : 502/.8
• 件名:
  • LCSH : Electron microscopy