Tutorial test generation for VLSI chips
著者
書誌事項
Tutorial test generation for VLSI chips
IEEE Computer Society Press , Order from IEEE Computer Society, c1988
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- タイトル別名
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Test generation for VLSI chips
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注記
A collection of reprints of articles originally published from 1967 to 1988
Includes bibliographies
"Computer Society order number 786."
IEEE catalog number EH0278-2."
内容説明・目次
内容説明
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.
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