Bibliographic Information

Applied logistic regression

David W. Hosmer, Jr., Stanley Lemeshow

(Wiley series in probability and mathematical statistics, . Applied probability and statistics)

Wiley, c1989

Available at  / 68 libraries

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Note

Bibliography: p. 291-300

Includes index

"A Wiley-Interscience publication."

Related Books: 1-1 of 1

Details

  • NCID
    BA07517813
  • ISBN
    • 0471615536
  • LCCN
    89031893
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York
  • Pages/Volumes
    xiii, 307 p.
  • Size
    24 cm
  • Classification
  • Subject Headings
  • Parent Bibliography ID
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