X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

Author(s)

• Christensen, Finn E.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 984）

SPIE--the International Society for Optical Engineering, c1988

Note

Includes bibliographies and index

Details

• NCID: BA07982154
• ISBN:
  • 081940019X
• LCCN: 88062305
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: viii, 271 p.
• Size: 28 cm
• Classification:
  • LCC : QC176.9.M84
  • DC20 : 621.36
• Subject Headings:
  • LCSH : Thin films, Multilayered -- Congresses
  • LCSH : X-rays -- Congresses
  • LCSH : Monochromator -- Surfaces -- Congresses
  • LCSH : Spectrometer -- Surfaces -- Congresses
  • LCSH : X-ray diffractometer -- Surfaces -- Congresses
• Parent Bibliography ID:
  • BA0022700X