X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

著者

• Christensen, Finn E.
• Society of Photo-optical Instrumentation Engineers

書誌事項

X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 984）

SPIE--the International Society for Optical Engineering, c1988

注記

Includes bibliographies and index

詳細情報

• NII書誌ID(NCID): BA07982154
• ISBN:
  • 081940019X
• LCCN: 88062305
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: viii, 271 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC176.9.M84
  • DC20 : 621.36
• 件名:
  • LCSH : Thin films, Multilayered -- Congresses
  • LCSH : X-rays -- Congresses
  • LCSH : Monochromator -- Surfaces -- Congresses
  • LCSH : Spectrometer -- Surfaces -- Congresses
  • LCSH : X-ray diffractometer -- Surfaces -- Congresses
• 親書誌ID:
  • BA0022700X