AT&T reliability manual

著者

• Klinger, David J.
• Nakada, Yoshinao
• Menendez, Maria A.
• AT & T Bell Laboratories

書誌事項

AT&T reliability manual

edited by David J. Klinger, Yoshinao Nakada, Maria A. Menendez (AT&T Bell Laboratories)

Van Nostrand Reinhold, c1990

注記

Rev. ed. of: Reliability information notebook. 5th ed

Includes bibliographical references

内容説明・目次

内容説明

Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA09965881
• ISBN:
  • 0442318480
• LCCN: 89024887
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xi, 225 p.
• 大きさ: 27 cm
• 分類:
  • LCC : TK5103
  • DC20 : 621.382
• 件名:
  • LCSH : Telecommunication -- Apparatus and supplies -- Reliability