Scanning electron microscopy 1971 : proceedings of the [Part 1: April 27-29, 1971] fourth Annual Scanning Electron Microscope Symposium and [Part 2: April 30, 1971] Workshop on Forensic Applications of the Scanning Electron Microscope, Chicago, Illnois, 1971
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Scanning electron microscopy 1971 : proceedings of the [Part 1: April 27-29, 1971] fourth Annual Scanning Electron Microscope Symposium and [Part 2: April 30, 1971] Workshop on Forensic Applications of the Scanning Electron Microscope, Chicago, Illnois, 1971
IIT Research Institute, 1971
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注記
Part 1: sponsored by IIT Research Institute
Part 2: sponsored by the National Institute of Law Enforcement and Criminal Justice (LEAA, U.S. Department of Justice), and IIT Research Institute
Includes bibliographical references and index