Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

著者

• International Symposium on Defect Recognition and Image Processing in III-V Compounds
• Ogawa, T.

書誌事項

Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

edited by T. Ogawa

（Journal of crystal growth, v. 103, no. 1-4）

North-Holland, 1990

詳細情報

• NII書誌ID(NCID): BA10947898
• 出版国コード: ne
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam
• ページ数/冊数: xi, 474 p.
• 大きさ: 26 cm
• 分類:
  • LCC : TK7871.85
  • DC19 : 621.3815/2
• 件名:
  • LCSH : Semiconductors -- Defects -- Congresses
  • LCSH : Gallium arsenide -- Congresses
  • LCSH : Image processing -- Congresses
• 親書誌ID:
  • BA07743980