New characterization techniques for thin polymer films

著者

書誌事項

New characterization techniques for thin polymer films

edited by Ho-ming Tong, Luu T. Nguyen

（SPE monographs）

Wiley, c1990

大学図書館所蔵 件 / 全13件

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注記

"A Wiley-Interscience publication."

Includes bibliographical references and index

内容説明・目次

内容説明

This book covers principles, advantages and drawbacks of recently developed methods for characterization of thin films. Each chapter is self-sufficient with its own separate section on background, theory, experimental set-up and procedures, and applications.

目次

  • Microdielectrometry (D. Day)
  • Bending-Beam Characterization of Thin Polymer Films (H. Tong & K. Saenger)
  • Polymer Film Stress Measurement by X-Ray Diffraction (L. Nguyen)
  • Laser Interferometry: A Measurement Tool for Thin Film Polymer Properties and Processing Characteristics (K. Saenger & H. Tong)
  • Piezoelectric Resonators: Considerations for Use with Mechanically Lossy Media (K. Kanazawa)
  • Ion Beam Analysis of Thin Polymer Films (P. Green & B. Doyle)
  • Fluorescence Redistribution After Pattern Photobleaching (B. Smith)
  • Surface Sensors for Moisture and Stress Studies (L. Nguyen)
  • Photothermal Analysis of Thin Polymer Films( H. Coufal)
  • Thermally Stimulated Discharge Current Measurement for Thin Polymer Films (B. Chowdhury)
  • XPS/SIMS/AES for Surface and Interface Characterization of Thin Polymer Films (N. Chou)
  • Prospects for Examination of Polymer Molecules with Scanning Tunneling Microscope and Atomic Force Microscope (D. Reneker)
  • Adhesion Measurement of Thin Polymer Films by Indentation (M. Matthewson & J. Ritter)
  • Subject Index.

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