High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

著者

• Sinclair, Robert
• Smith, David J.
• Dahmen, Ulrich
• Materials Research Society

書誌事項

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

editors, Robert Sinclair, David J. Smith, Ulrich Dahmen

（Materials Research Society symposium proceedings, v. 183）

Materials Research Society, c1990

注記

Inclcudes bibliographical references

Includes index

内容説明・目次

内容説明

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA11043199
• ISBN:
  • 1558990720
• LCCN: 90041466
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, Pa.
• ページ数/冊数: xi, 391 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.23
  • DC20 : 620.1/1299
• 件名:
  • LCSH : Materials -- Microscopy -- Congresses
  • LCSH : Materials -- Defects -- Congresses
  • LCSH : Electron microscopy -- Congresses
• 親書誌ID:
  • BA00013775