High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
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Bibliographic Information
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
（Materials Research Society symposium proceedings, v. 183）
Materials Research Society, c1990
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Inclcudes bibliographical references
Includes index
Description and Table of Contents
Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
by "Nielsen BookData"