Physical measurement and analysis of thin films

Author(s)

• Eastern Analytical Symposium
• Murt, E. M.
• Guldner, W. G.

Bibliographic Information

Physical measurement and analysis of thin films

edited by E. M. Murt and W. G. Guldner

（Progress in analytical chemistry, v. 2）

Plenum Press, 1969

Note

Includes bibliographies

Details

• NCID: BA11236002
• LCCN: 68031239
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xi, 194 p.
• Size: 24 cm
• Classification:
  • LCC : QC176
  • DC : 530.4/1
• Subject Headings:
  • LCSH : Thin films -- Addresses, essays, lectures
• Parent Bibliography ID:
  • BA11236090