VLSI system test : cost versus quality : 1990 IEEE Test Symposium, April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ

著者

• IEEE Test Symposium
• IEEE Computer Society
• Institute of Electrical and Electronics Engineers. Philadelphia Section
• IEEE Computer Society. Test Technology Committee

書誌事項

VLSI system test : cost versus quality : 1990 IEEE Test Symposium, April 10-11, 1990, Bally's Park Place Casino Hotel, Atlantic City, NJ

IEEE Computer Society Press, 1990]

タイトル別名

VLSI system test : cost vs. quality

注記

At head of title: IEEE Philadelphia Section. IEEE Computer Society, Test Technology Committee

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA12135113
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Los Alamitos, CA?
• ページ数/冊数: 1 v.
• 大きさ: 28 cm
• 件名:
  • FREE : Integrated circuits -- Testing -- Congresses