Nondestructive evaluation of semiconductor materials and devices

Author(s)

• NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices
• Zemel, Jay N.

Bibliographic Information

Nondestructive evaluation of semiconductor materials and devices

edited by Jay N. Zemel

（NATO advanced study institutes series, Series B . Physics ; v. 46）

Plenum Press, c1979

Note

Lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluationof Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy,September 19-29, 1978

Includes bibliographical references and index

"Published in cooperation with NATO Scientific Affairs Division."

Details

• NCID: BA13158566
• ISBN:
  • 0306402939
• LCCN: 79016499
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: xi, 782 p.
• Size: 26 cm
• Classification:
  • LCC : TK7871.85
  • DC : 621.3815/2/028
• Subject Headings:
  • LCSH : Semiconductors -- Testing -- Congresses
• Parent Bibliography ID:
  • BA00221036