書誌事項

Images of materials

edited by David B. Williams, Alan R. Pelton, Ronald Gronsky ; with a foreword by Sir Peter B. Hirsch

Oxford University Press, 1991

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their appearance. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunnelling microscopes, acoustic microscopy and transmission electron microscopy. The book describes how images are processed and analysed, and how modern materials science is based on these techniques and their ability to "see" materials at the atomic level. The book includes hundreds of illustrations and colour plates, making it a pleasure to the eye.

目次

  • Imaging by light optical microscopy
  • Scanning electron microscopy
  • Analytical imaging with a scanning ion microprobe
  • Acoustic microscopy
  • Transmission electron microscopy
  • Electron diffusion images
  • Atomic resolution microscopy
  • Surface imaging by scanning tunneling microscopy
  • Atom probe field-ion microscopy: imaging at the atomic level
  • Compositional mapping of the microstructure of materials
  • Processing images and selecting regions of interest
  • Image analysis of the microstructure of materials.

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詳細情報

  • NII書誌ID(NCID)
    BA13730870
  • ISBN
    • 0195058569
  • LCCN
    90014181
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    New York
  • ページ数/冊数
    xiv, 379 p.
  • 大きさ
    ill. (some col.) ; 29 cm
  • 分類
  • 件名
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