Electron microscopy and analysis, 1991 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Bristol, 10-13 September 1991,
著者
書誌事項
Electron microscopy and analysis, 1991 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Bristol, 10-13 September 1991,
（Institute of Physics conference series, no. 119）
Institute of Physics, c1991
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
These proceedings present papers in instrumentation and techniques for electron and other microscopies. The theme of this conference was the physics of imaging and microanalytical processes.
目次
Surface analysis. High resolution electron microscopy. Electron energy loss spectroscopy. Environmental electron microscopy. Scanning and auger electron microscopy. Applications - metals and semiconductors. Applications - ceramics and inorganics. Beam damage and beam sensitive materials. Convergent beam electron diffraction. Microanalysis. Alternative imaging. New instrumentation. Late papers.
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