Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

Author(s)

• Lloyd, J. R. (James R.)
• Yost, Frederick G.
• Ho, P. S.
• Materials Research Society
• MRS Symposium on Materials Reliability Issues in Microelectronics

Bibliographic Information

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho

（Materials Research Society symposium proceedings, v. 225）

Materials Research Society, c1991

Note

Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics

Includes bibliogrpahical references and index

Details

• NCID: BA14185757
• ISBN:
  • 1558991190
• LCCN: 91030404
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Pittsburgh, Pa.
• Pages/Volumes: xiii, 358 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874
  • DC20 : 621.381
• Subject Headings:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• Parent Bibliography ID:
  • BA00013775