Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
Author(s)
Bibliographic Information
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
（Materials Research Society symposium proceedings, v. 225）
Materials Research Society, c1991
Available at / 11 libraries
-
No Libraries matched.
- Remove all filters.
Note
Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics
Includes bibliogrpahical references and index
Description and Table of Contents
Description
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.
by "Nielsen BookData"
