Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

書誌事項

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho

(Materials Research Society symposium proceedings, v. 225)

Materials Research Society, c1991

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注記

Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics

Includes bibliogrpahical references and index

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