CiNii Books 著者

1

Stress induced phenomiena and reliability in 3D microelectronics, Kyoto, Japan, 28-30 May 2012

Paul S. Ho ... [et al.], editors

Curran Associate c2014 AIP conference proceedings v. 1601

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2

Stress-induced phenomena in metallization : seventh international workshop on stress-induced phenomena in metallization : Austin, Texas, 14-16 June 2004

editors, Paul S. Ho ... [et al.]

American Institute of Physics c2004 AIP conference proceedings 741

所蔵館2館
3

Low dielectric constant materials for IC applications

P.S. Ho, J. Leu, W.W. Lee (eds.)

Springer c2003 Advanced microelectronics 9

所蔵館3館
4

Stress-induced phenomena in metallization : sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001

editors, Shefford P. Baker ... [et al.]

American Institute of Physics c2002 AIP conference proceedings v. 612

所蔵館4館
5

Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan June 1997

editors, Hidekazu Okabayashi, Shoso Shingubara, Paul S. Ho

American Institute of Physics c1998 AIP conference proceedings 418

所蔵館8館
6

Stress-induced phenomena in metallization : third international workshop, Palo Alto, CA June 1995

editors, Paul S. Ho, John Bravman, Che-Yu Li

American Institute of Physics c1996 AIP conference proceedings 373

所蔵館6館
7

Stress-induced phenomena in metallization : second international workshop, Austin, TX March 1993

editors, Paul S. Ho, Che-Yu Li, Paul Totta

American Institute of Physics c1994 AIP conference proceedings 305

所蔵館11館
8

Electronic packaging materials science VI : symposium held April 27-30, 1992, San Francisco, California, U.S.A.

editors, Paul S. Ho ... [et al.]

Materials Research Society c1992 Materials Research Society symposium proceedings v. 264

所蔵館6館
9

Stress-induced phenomena in metallization : first international workshop, Ithaca, NY 1991

editors: Che-Yu Li, Paul Totta, Paul Ho

American Institute of Physics c1992 AIP conference proceedings 263 , American Vacuum Society series 13

所蔵館11館
10

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho

Materials Research Society c1991 Materials Research Society symposium proceedings v. 225

所蔵館11館
11

Diffusion phenomena in thin films and microelectronic materials

edited by Devendra Gupta and Paul S. Ho

Noyes Publications c1988

所蔵館6館
12

Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA

editors, R.J. Nemanich, P.S. Ho, S.S. Lau

Materials Research Society c1986 Materials Research Society symposium proceedings v. 54

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13

Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.

editors, P.S. Ho, K.N. Tu

North-Holland c1982 Materials Research Society symposium proceedings v. 10

所蔵館32館
14

Low temperature diffusion and applications to thin films : proceedings of an international conference held on August 12-14, 1974, Yorktown Heights, New York

ed. by A. Gangulee, P. S. Ho and K. N. Tu (Program committee)

Elsevier Sequoia S.A. 1975

所蔵館5館

Ho, P. S.

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