Electron diffraction techniques

著者

• Cowley, J. M. (John Maxwell)

書誌事項

Electron diffraction techniques

edited by John M. Cowley

（International Union of Crystallography monographs on crystallography, 3-4）

International Union of Crystallography , Oxford University Press, 1992-1993

• v. 1
• v. 2

注記

Includes index

内容説明・目次

巻冊次

v. 1 ISBN 9780198555582

内容説明

This two-volume work forms a comprehensive treatise on the theory and applications of electron-diffraction techniques, and has been organized under the auspices of the Electron Diffraction Commission of the International Union of Crystallography. All those embarking on research which involves the use of electron diffraction methods, including graduate students and more experienced researchers who wish to add electron diffraction to their array of research tools will find this an invaluable reference. Volume 1 contains introductory chapters and the sections on electron diffraction which are less dependent on considerations of imaging in electron microscopes. Volume 2 deals with those aspects where there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.

目次

• J.M. Cowley: Electron diffraction: an introduction
• C.J. Humphreys & E.G. Bittell: Electron diffraction theory
• J.M. Cowley: Diffraction imaging in electron microscopy
• J. Barry: Computing for high resolution images and diffraction patterns
• M. Carr & C. Lyman: Indentification of unknowns (extended Abstract)
• B.K. Vainshtein, B.B. Zyyagin, & A.S. Avilov: Electron diffraction structure analysis
• A. Eades: Convergent-beam diffraction
• J.C.H. Spence: Accurate structure factor amplitude and phase determination
• J.M. Cowley: Coherent convergent beam diffraction
• J.C.H. Spence: Electron channelling and its uses
• Istvan Hargittai: Gas electron diffraction
• Appendix
• Index.

巻冊次

v. 2 ISBN 9780198557333

内容説明

Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.

目次

• S. Amelinckx & D. van Dyck: EM imaging and diffraction contrast
• K. Yagi: Rheed and REM
• J. Gjonnes: Disorder and defect scattering
• S. Amelinckx & D. van Dyck: Electron diffraction effects due to modulated structures
• M. Carr & C. Lyman: Identifications of unknowns
• Index.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA18551358
• ISBN:
  • 019855558X
  • 0198557337
• LCCN: 92015015
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Chester, England],Oxford ; New York
• ページ数/冊数: 2 v.
• 大きさ: 24 cm
• 分類:
  • LCC : QD921
  • DC20 : 548/.83
• 件名:
  • LCSH : Crystallography
  • LCSH : Electrons -- Diffraction
• 親書誌ID:
  • BA14312752