Digital hardware testing : transistor-level fault modeling and testing

Author(s)

• Rajsuman, Rochit

Bibliographic Information

Digital hardware testing : transistor-level fault modeling and testing

Rochit Rajsuman

（The Artech House telecommunication library）

Artech House, c1992

Note

"Annotated bibliography": p. 303-310

Includes bibliographical references and index

Details

• NCID: BA1863679X
• ISBN:
  • 0890065802
• LCCN: 92007350
• LCCN: 92008800
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boston
• Pages/Volumes: xv, 317 p.
• Size: 24 cm
• Classification:
  • LCC : TK7888.4
  • DC20 : 621.39/5/0287
• Subject Headings:
  • LCSH : Electronic digital computers -- Circuits -- Testing -- Data processing
  • LCSH : Integrated circuits -- Very large scale -- Testing -- Data processing
  • LCSH : Fault-tolerant computing
• Parent Bibliography ID:
  • BA00899063