CiNii Books Author - Rajsuman, Rochit

1

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society c2004

Available at 1 libraries
2

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society c2003

Available at 2 libraries
3

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society

Institute of Electrical and Electronics Engieers c2000

:case.

Available at 1 libraries
4

System-on-a-chip : design and test

Rochit Rajsuman

Artech House 2000

Available at 14 libraries
5

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society

Institute of Electrical and Electronics Engieers c1999

Available at 1 libraries
6

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1997

Available at 1 libraries
7

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1996

Available at 1 libraries
8

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press c1995

Available at 2 libraries
9

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press c1994

Available at 3 libraries
10

Bridging faults and IDDQ testing

[edited] by Y.K. Malaiya and R. Rajsuman

IEEE Computer Society Press 1992 IEEE Computer Society Press technology series

: pbk. , : fiche

Available at 3 libraries
11

Digital hardware testing : transistor-level fault modeling and testing

Rochit Rajsuman

Artech House c1992 The Artech House telecommunication library

Available at 5 libraries

Rajsuman, Rochit

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