Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

著者

• Thompson, C. V. (Carl V.)
• Lloyd, J. R. (James R.)

書誌事項

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

editors: C.V. Thompson, J.R. Lloyd

（Materials Research Society symposium proceedings, v. 265）

Materials Research Society, c1992

注記

Includes bibliographical references and index

内容説明・目次

内容説明

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA18823607
• ISBN:
  • 1558991603
• LCCN: 92027362
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pittsburgh, PA
• ページ数/冊数: ix, 328 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.381
• 件名:
  • LCSH : Microelectronics -- Reliability -- Congresses
  • LCSH : Microelectronics -- Materials -- Testing -- Congresses
  • LCSH : Electrodiffusion -- Congresses
  • LCSH : Microstructure -- Congresses
• 親書誌ID:
  • BA00013775