Redundant disk arrays : reliable, parallel secondary storage

書誌事項

Redundant disk arrays : reliable, parallel secondary storage

Garth A. Gibson

(ACM distinguished dissertations, 1991)

MIT Press, c1992

この図書・雑誌をさがす
注記

Includes bibliographical references (p. [257]-281) and index

内容説明・目次

内容説明

Disk arrays, coupled with emerging small disk technology, promise to provide a badly needed increase in the performance of secondary storage systems. Because high failure rates arise with a large number of disks, however, simple redundancy schemes are used to ensure data reliability. This monograph investigates the data encoding, performance, and reliability of redundant disk arrays. Gibson reviews the performance advantages of stripping data across multiple disks, evaluates the performance lost to the maintenance of redundant data, provides evidence that disk lifetimes can be modelled as exponential random variables, and develops and applies analytic models of data reliability in redundant disk arrays suffering dependent failure modes and featuring on-line spare disks.

目次

  • Part 1 The importance of input/output: revisiting an old problem
  • rapidly growing processor performance
  • new secondary storage technologies
  • replacing disks with DRAM - how soon? Part 2 Redundant disk arrays: the emergence of disk arrays
  • disk arrays as a threat to data reliability
  • encoding data for one-line reduencancy
  • performance of redundant disk arrays. Part 3 Characterizing disk lifetimes: characterizing catastrophic disk failures
  • in search of data on lifetime distributions
  • improving disk mean lifetimes
  • a sample of lifetime data. Part 4 Reliability modeling: reliability metric
  • related work
  • tools and methods
  • independent disk failures
  • independent disk failures with on-line spares
  • dependent disk failures with on-line spares. Apendices: reliability simulation - introducing RELI, parity group organization in a set of strings, modeling repair, recovery, and replenishing, verifying RELI, terminating RELI
  • effect of reliability of error in MTTDL
  • goodness-of-fit testing
  • comparison data for chapter 5.

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