Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Digest of papers : 1991 IEEE VLSI Test Symposium : chip-to-system test concerns for the 90's : April 15-17, 1991, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

IEEE, c1991

• : soft.
• : micro.

タイトル別名

Chip-to-system test concerns for the 90's

91TH03533

注記

Includes bibliographical references

"IEEE catalog number 91TH0353-3"--T.p. verso

詳細情報

• NII書誌ID(NCID): BA19123906
• ISBN:
  • 0780301889
  • 0780301897
• LCCN: 90085699
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York, NY (345 E. 47th St., New York 10017)
• ページ数/冊数: vii, 308 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC20 : 621.39/5/0287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses