ID:DA08735769
VLSI Test Symposium, IEEE
IEEE Test Symposium--VLSI
同姓同名の著者を検索
IEEE c2011
所蔵館1館
IEEE c2010
IEEE c2009
IEEE Computer Society c2009
IEEE Computer Society c2008
[sponsored by IEEE Computer Society Test Technology Technical Council]
IEEE Computer Society c2007
所蔵館2館
sponsored by IEEE Computer Society Test Technology Technical Council
IEEE Computer Society c2006
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)
IEEE Computer Society c2005
IEEE Computer Society c2004
所蔵館6館
IEEE Computer Society c2003
所蔵館3館
IEEE Computer Society c2002
所蔵館4館
IEEE Computer Society c2001
: [soft.] , : case.
所蔵館5館
IEEE Computer Society c2000
IEEE Computer Society c1999
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section
IEEE Computer Society c1998
IEEE Computer Society Press c1997
: pbk
sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section
IEEE Computer Society Press c1996
IEEE Computer Society Press c1995
pbk.
IEEE Computer Society Press c1994
sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE
IEEE Computer Society Press c1993
: soft. , : micro.