Many-beam electron diffraction related to electron microscope diffraction contrast

著者

    • Kästner, Garhard

書誌事項

Many-beam electron diffraction related to electron microscope diffraction contrast

by Gerhard Kästner

(Physical research, v. 18)

Akademie Verlag Gmbh, c1993

1st ed

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内容説明・目次

内容説明

As electron microscopy is concerned with objects of more complex crystallographic structures using instruments of higher acceleration voltages, one more and more encounters features of many-beam electron diffraction. This expands the methodical varieties, particularly of imaging crystal defects by diffraction contrast. This work is designed to serve as a theoretical and practical guide for exploiting these possibilities. It comprehensively reviews the required dynamical and kinetical diffraction theory thus closing some gaps, eg by systematically comparing "ordinary" and "modified" Bloch waves, or by denoting conditions of a first-order critical voltage effect. It is shown how to classify and simplify many-beam situations and imaging conditions. Besides typical examples, data files are given in which extinction distances up to 1 MV accelerating voltage are included.

目次

  • The wave field within the crystal - Bloch wave representation and the fundamental equation of the dynamical theory
  • analytical approximate solutions of the eigenvalue equation
  • a comparison of the differential equations of electron diffraction in strained crystals
  • approximations for analytically obtaining scattering matrix of a deformed crystal
  • diffraction contrast at dynamical excitation
  • diffraction contrast at kinematical excitation.

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詳細情報

  • NII書誌ID(NCID)
    BA1943702X
  • ISBN
    • 3055013085
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Berlin
  • ページ数/冊数
    96, xii p.
  • 大きさ
    25 cm
  • 親書誌ID
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