Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

著者

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section

The Society : Institute of Electrical and Electronics Engineers, c1992

タイトル別名

Design, test, and application, SICs and systems-on-a-chip

92TH04374

注記

"IEEE catalog number 92TH0437-4"

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA19451869
• ISBN:
  • 0780306236
• LCCN: 92052730
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: xiv, 344 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874.6
  • DC20 : 621.39/5
• 件名:
  • LCSH : Application specific integrated circuits -- Congresses
  • LCSH : Application specific integrated circuits -- Testing -- Congresses
  • LCSH : Application specific integrated circuits -- Design -- Congresses