Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

Author(s)

• IEEE VLSI Test Symposium
• IEEE Computer Society. Test Technology Technical Committee
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Digest of papers : 1992 IEEE VLSI Test Symposium 10th anniversary, April 7-9, 1992, Bally's Park Place Casino Hotel, Atlantic City, New Jersey, USA : design, test, and application, ASICs and systems-on-a-chip

sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section

The Society : Institute of Electrical and Electronics Engineers, c1992

Other Title

Design, test, and application, SICs and systems-on-a-chip

92TH04374

Note

"IEEE catalog number 92TH0437-4"

Includes bibliographical references

Details

• NCID: BA19451869
• ISBN:
  • 0780306236
• LCCN: 92052730
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [New York]
• Pages/Volumes: xiv, 344 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874.6
  • DC20 : 621.39/5
• Subject Headings:
  • LCSH : Application specific integrated circuits -- Congresses
  • LCSH : Application specific integrated circuits -- Testing -- Congresses
  • LCSH : Application specific integrated circuits -- Design -- Congresses