Semiconductor measurements and instrumentation

Author(s)

• Runyan, W. R.

Bibliographic Information

Semiconductor measurements and instrumentation

W. R. Runyan

（Texas Instruments electronics series）

McGraw-Hill, [1975]

International student edition

Note

Includes bibliographical references and index

Details

• NCID: BA1952825X
• ISBN:
  • 0070542732
• LCCN: 75019035
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: vii, 280 p.
• Size: 26 cm
• Classification:
  • LCC : QC611.24
  • DC : 537.6/22
• Subject Headings:
  • LCSH : Semiconductors
• Parent Bibliography ID:
  • BA07535225