The physics of SiO[2] and its interfaces : proceedings of the International Topical Conference on the Physics of SiO[2] and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
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The physics of SiO[2] and its interfaces : proceedings of the International Topical Conference on the Physics of SiO[2] and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
Pergamon Press, c1978
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Includes bibliographical references and index
