Symposium on advances in electron metallography and electron probe microanalysis : held at Atlantic City, N.J., June 28, 1960, and June 26, 1961

著者

• Symposium on Advances in Electron Metallography
• American Society for Testing and Materials. Committee E-4 on Metallography

書誌事項

Symposium on advances in electron metallography and electron probe microanalysis : held at Atlantic City, N.J., June 28, 1960, and June 26, 1961

sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography

（ASTM special technical publication, no. 317）

ASTM, 1962

注記

This is v.3 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

詳細情報

• NII書誌ID(NCID): BA20544253
• LCCN: 62018223
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Philadelphia, Pa.
• ページ数/冊数: v, 207 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00068096