Algorithms for synthesis and testing of asynchronous circuits

著者

• Lavagno, Luciano
• Sangiovanni-Vincentelli, Alberto

書誌事項

Algorithms for synthesis and testing of asynchronous circuits

Luciano Lavagno, Alberto Sangiovanni-Vincentelli

（The Kluwer international series in engineering and computer science, SECS 232 . VLSI, computer architecture, and digital signal processing）

Kluwer Academic, c1993

注記

Includes bibliographical references (p. 309-320) and index

• NII書誌ID(NCID): BA20674452
• ISBN:
  • 0792393643
• LCCN: 93019510
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xviii, 339 p.
• 大きさ: 25 cm
• 分類:
  • LCC : TK7888.4
  • DC20 : 621.39/5
• 件名:
  • LCSH : Electronic digital computers -- Circuits -- Testing
  • LCSH : Electronic digital computers -- Circuits -- Mathematical models
• 親書誌ID:
  • BA0004729X